NanoMEGAS was established in 2004 specialising in advanced electron diffraction techniques for TEM. We were the first to develop and commercialise Precession Electron Diffraction (PED) products to reduce dynamical effects and improve the application of electron diffraction techniques in TEM. These applications include: Phase & Orientation Mapping (ASTAR) at 1 nm scale, Strain mapping with a sensitivity of 0.02% and 2-3 nm resolution, Diffraction Tomography (ADT-3D) for crystal structure determination of nm sized crystals and Electron Pair Distribution Function (e-PDF) for analysis of amorphous materials. This advanced product range is compatible with most commercial TEMs including modern Cs corrected TEMs’.